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Research
Projects:
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Collab.: J.-J.
Métois, P. Műller, F.
Leroy (Cinam Marseille, France), C.
Misbah (LiPhy Grenoble, France), K.
Martens (LiPhy Grenoble).
In
the presence of an electric current,
mobile atoms experience a drift,
which is called electromigration.
Surface electromigration is known as
major source of rupture of
microstructures, and is also a
interesting tool for spontaneous
nano-structure formation. In the
past 15 years,
electromigration-induced
instabilities at the micro, or
nanometer scales have been studied
intensively. We have for example
studied the pairing and bunching of
atomic steps, or the drift of small
clusters under electromigration.
More recently, we have studied the
coupling of electromigration and
facetting.
more
in slides
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Reflection Electron Microscope
of pairs of atomic steps on Silicon (111).
Depending on the strength of
electromigration surface facetting can
be enhanced or eliminated
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